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検索キーワード:(標準分類: TA417.23)
該当件数:6件
Electron microscopy of materials : symposium held November 1983 in Boston, Massachusetts, U.S.A. / editors, William Krakow, David A. Smith, Linn W. Hobbs
New York : North-Holland , c1984. - (Materials Research Society symposium proceedings ; v. 31)
図書
Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy
New York : Plenum Press , c1979
Electron beam analysis of materials / M.H. Loretto
: pbk. - London ; New York : Chapman and Hall , 1984
Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe
Berlin ; Tokyo : Springer , 2001
Structural and chemical analysis of materials : X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy / J.P. Eberhart ; translated by J.P. Eberhart
: pbk. - Chichester, England ; New York : Wiley , c1991
Microstructural characterization of materials / David Brandon and Wayne D. Kaplan
: cloth,: paper. - 2nd ed. - Chichester : Wiley , c2008