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該当件数:17件
Electron microscopy and analysis, 1979 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) / edited by T. Mulvey
Bristol : Institute of Physics , 1980. - (Institute of Physics conference series ; no. 52)
図書
Electron microscopy and analysis, 1981 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Cambridge, 7-10 September 1981 (EMAG 81) / edited by M.J. Goringe
Bristol : Institute of Physics , c1982. - (Institute of Physics conference series ; no.61)
Electron microscopy and analysis, 1983 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Guildford, 30 August-2 September 1983 (EMAG 83) / edited by P. Doig
Bristol : Institute of Physics , c1984. - (Institute of Physics conference series ; no. 68)
Electron microscopy and analysis, 1985 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Newcastle upon Tyne, 2-5 September 1985 (EMAG 85) / edited by G.J. Tatlock
Bristol ; Boston : A. Hilger , c1986. - (Institute of Physics conference series ; no.78)
Examining the submicron world / edited by Ralph Feder, J. Wm. McGowan and Douglas M. Shinozaki
New York : Plenum Press , c1986. - (NATO ASI series ; ser. B . Physics ; v. 137)
Recent development of electron microscopy 1985 : proceedings of the Third Chinese-Japanese Electron Microscopy Seminar held in Hanzhou from November 4 to November 7 in 1985 / organized by Chinese Electron Microscopy Society ; edited by H. Hashimoto ... [et al.]
Tokyo, Japan : International Dept., Business Center for Academic Societies Japan , c1986
Recent development of electron microscopy : proceedings of the Second Chinese-Japanese Electron Microscopy Seminar held in Beijing from October 17 to October 19 in 1983 / organized by Chinese Society of Electron Microscopy ; edited by H. Hashimoto ... [et al.]
Tokyo, Japan : International Dept., Business Center for Academic Societies Japan , c1985
Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr
New York : Marcel Dekker , c1982. - (Optical engineering ; v. 1)
High-resolution transmission electron microscopy and associated techniques / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
New York : Oxford University Press , 1988
Scanning tunneling microscopy and its application / Chunli Bai
: Berlin,: Shanghai. - New York : Springer , 1995. - (Springer series in surface sciences ; 32)
Electron holography / Akira Tonomura
2nd ed. - Berlin ; New York : Springer-Verlag , c1999. - (Springer series in optical sciences ; v. 70)
Topics in electron diffraction and microscopy of materials / P.B. Hirsch, [ed.]
Bristol ; Philadelphia, PA : Institute of Physics Pub. , c1999. - (Microscopy in materials science series)
Electron holography : proceedings of the International Workshop on Electron Holography, Holiday Inn World's Fair, Knoxville, Tennessee, USA, August 29-31, 1994 / edited by A. Tonomura ... [et al.]
Amsterdam ; New York : Elsevier , 1995. - (North-Holland delta series)
Scanning electron microscopy and x-ray microanalysis / Robert Edward Lee
Englewood Cliffs, N.J. : PTR Prentice Hall , c1993
Fundamentals of high-resolution transmission electron microscopy / S. Horiuchi
Amsterdam : North-Holland , 1994
Dynamic experiments in the electron microscope / E.P. Butler, K.F. Hale
: hbk,: pbk. - Amsterdam ; New York : North-Holland Pub. Co.. - New York : Sole distributors for the U.S.A. and Canada, Elsevier/North-Holland , 1981. - (Practical methods in electron microscopy / edited by Audrey M. Glauert ; v. 9)
Thin foil preparation for electron microscopy / P.J. Goodhew
: hard,: pbk. - Amsterdam ; New York : Elsevier , 1985. - (Practical methods in electron microscopy / edited by Audrey M. Glauert ; v. 11)