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検索キーワード:(標準分類: 620.1/1299)
該当件数:5件
Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe
Berlin ; Tokyo : Springer , 2001
図書
Structural and chemical analysis of materials : X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy / J.P. Eberhart ; translated by J.P. Eberhart
: pbk. - Chichester, England ; New York : Wiley , c1991
Particle size distribution : assessment and characterization / Theodore Provder, editor
Washington, D.C. : American Chemical Society , 1987. - (ACS symposium series ; 332)
Materials analysis by ion channeling : submicron crystallography / Leonard C. Feldman, James W. Mayer, S. Thomas Picraux
New York ; Tokyo : Academic Press , 1982
Microstructural characterization of materials / David Brandon and Wayne D. Kaplan
: cloth,: paper. - 2nd ed. - Chichester : Wiley , c2008