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v. 1
Progress in pattern recognition / edited by Laveen N. Kanal and Azriel Rosenfeld
v. 2. - Amsterdam ; New York : North-Holland. - New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co. , 1985
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| 2 |
v. 3
Techniques for 3-D machine perception / edited by Azriel Rosenfeld
Amsterdam ; New York : North-Holland , 1986
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| 3 |
v. 4, 5, 8, 9, 10, 12
Uncertainty in artificial intelligence / edited by Laveen N. Kanal and John F. Lemmer
1 : hard - 6. - Amsterdam ; Tokyo : North-Holland , 1986-
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| 4 |
v. 6
Computational morphology : a computational geometric approach to the analysis of form / edited by Godfried T. Toussaint
Amsterdam ; Tokyo : North-Holland. - New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science , 1988
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| 5 |
v. 7
Pattern recognition and artificial intelligence : towards an integration : proceedings of an international workshop held in Amsterdam, May 18-20, 1988 / edited by Edzard S. Gelsema and Laveen N. Kanal
Amsterdam ; Tokyo : North Holland. - New York, N.Y. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co. , 1988
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| 6 |
v. 11
Artificial neural networks and statistical pattern recognition : old and new connections / edited by Ishwar K. Sethi, Anil K. Jain
: pbk.. - Amsterdam ; New York : North-Holland. - New York, N.Y., U.S.A. : Elsevier Science Pub. Co. [distributor] , 1991
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| 7 |
v. 17
Uncertainty modelling and analysis : theory and applications / edited by Bilal M. Ayyub, Madan M. Gupta
Amsterdam ; Tokyo : Elsevier , 1994
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