Structural and chemical analysis of materials : X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy / J.P. Eberhart ; translated by J.P. Eberhart
Material Type | Books |
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Publisher | Chichester, England ; New York : Wiley |
Year | c1991 |
Language | English |
Size | xxx, 545 p. : ill. ; 26 cm |
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Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Reserve | Designated Book |
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Laboratory |
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501.4||E7||1e | 9920047214 |
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1Fシラバス掲載図書 | : pbk | 501.4||E7||1e | 9200114412 |
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シラバス2024年度 |
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Other titles | original title:Analyse structurale et chimique des matériaux. Diffraction des rayons X, neutrons et électrons, spectrométrie des rayons X, électrons et ions, microscopie électronique |
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Notes | Translation of: Analyse structurale et chimique des matériaux. Diffraction des rayons X, neutrons et électrons, spectrométrie des rayons X, électrons et ions, microscopie électronique Includes bibliographical references and index |
Authors | *Eberhart, J. -P. (Jean-Pierre) |
Classification | LCC:TA417.23 DC20:620.1/1299 |
Subjects | LCSH:Materials -- Microscopy
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LCSH:Microstructure |
ID | TY00015279 |
ISBN | 0471929778 |
NCID | BA12872654 |