Defects in crystalline solids
データ種別 | 図書 |
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出版者 | Amsterdam : North-Holland Pub. Co |
本文言語 | und |
子書誌情報を非表示
1 | v. 7 Computed electron micrographs and defect identification / A. K. Head ... [et al.] American Elsevier. - Amsterdam ; London : North-Holland. - New York : American Elsevier , 1973 |
2 | v. 9 Theory of metal oxidation / A.T. Fromhold, Jr. v. 1. Fundamentals. - Amsterdam : North Holland Pub. Co.. - New York : American Elsevier Pub. Co. , 1976- |
書誌詳細を非表示
書誌ID | BB00011878 |
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NCID | BA00818709 |