Workshop on Point, Extended, and Surface Defects in Semiconductors
著者名典拠詳細を表示
| 著者の属性 | 会議 |
|---|---|
| 一般注記 | Its (2nd : 1988 : Erice, Italy). Point and extended defects in semiconductors, c1989: CIP t.p. verso (Second Workshop on Point, Extended, and Surface Defects in Semiconductors, held Nov. 2-7, 1988 in Erice, Italy) |
| コード類 | 典拠ID=AU20073856 NCID=DA03961578 |
| 1 | Point and extended defects in semiconductors / edited by G. Benedek, A. Cavallini, and W. Schröter New York : Plenum Press , c1989 |