Walls, J. M.
著者名典拠詳細を表示
| 著者の属性 | 個人 |
|---|---|
| 一般注記 | Thurstans, R. E. Field-ion microscopy and related techniques, 1980 (a.e.) t.p. (J. M. Walls, Dept. of Physics, Loughborough Univ. of Tech.) Methods of surface analysis, 1989 (J. M. Walls, VG Ionex, The Maltings, Burgess Hill, West Sussex RH159TQ, UK) |
| コード類 | 典拠ID=AU20071127 NCID=DA02965121 |
| 1 | Methods of surface analysis / edited by J.M. Walls Cambridge [Cambridgeshire] ; New York : Cambridge University Press , 1989 |