Goodhew, Peter J.
著者名典拠詳細を表示
| 著者の属性 | 個人 |
|---|---|
| 一般注記 | His Specimen preparation for transmission electron microscopy of materials, 1984: t.p. (Peter J. Goodhew; Dept. of Materiels Sci. and Engineering, U. of Surrey) Brit. CIP (Goodhew, Peter) LC data base, 2-6-85 (hdg.: Goodhew, P. J.; usage: P. J. Goodhew) EDSRC:Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland (Taylor & Francis, 2001): t.p. (Univ. of Liverpool, UK) |
| から見よ参照 | Goodhew, P. J. Goodhew, P. J. (Peter J.) |
| コード類 | 典拠ID=AU20012045 NCID=DA00348689 |
| 1 | EMAG-Micro 89 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group and Royal Microscopical Society Conference held in London, 13-15 September 1989 / edited by P.J. Goodhew and H.Y. Elder : set,v. 1: Physical,v. 2: Biological. - Bristol : IOP Publishing , 1990 |
| 2 | Thin foil preparation for electron microscopy / P.J. Goodhew : hard,: pbk. - Amsterdam ; New York : Elsevier , 1985 |
| 3 | 電子顕微鏡使用法 / P.J.Goodhew[著] ; 菊田惺志訳 東京 : 共立出版 , 1981.10 |
| 4 | Specimen preparation in materials science / P.J. Goodhew North-Holland,American Elsevier. - Amsterdam : North-Holland. - New York : American Elsevier , 1973, c1972 |
| 5 | Specimen preparation in materials science / P.J. Goodhew . Electron diffraction and optical diffraction techniques / B.E.P. Beeston, Robert W. Horne and Roy Markha Amsterdam ; London : North-Holland Pub. Co.. - New York : American Elsevier Pub. Co. , 1972 |