Joy, David C., 1943-
著者名典拠詳細を表示
| 著者の属性 | 個人 |
|---|---|
| 一般注記 | Introd. to analytical electron microscopy, c1979 (a.e.) CIP t.p. (David Joy, Bell Labs., Murray Hill, N. J.) book t.p. (David C. Joy) FTS call to author, 6/7/79 (David Charles Joy; b. 11/15/43) EXAFS spectroscopy, c1981 (a.e.) t.p. (D. C. Joy) |
| Dates of Birth and Death | 1943 |
| から見よ参照 | Joy, D. C. (David Charles), 1943- Joy, David Charles, 1943- |
| コード類 | 典拠ID=AU20006332 NCID=DA01136336 |
| 1 | Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein ... [et al.] : [hbk]. - 4th ed. - New York : Springer Science+Business Media , 2018 |
| 2 | EXAFS spectroscopy, techniques and applications / edited by B.K. Teo and D.C. Joy New York : Plenum Press , c1981 |
| 3 | Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy New York : Plenum Press , c1979 |