Kaplan, Wayne D.
著者名典拠詳細を表示
| 著者の属性 | 個人 |
|---|---|
| 一般注記 | Joining processes, c1997: CIP t.p. (Wayne D. Kaplan; Technion, Israel Inst. of Technol.) SRC:Microstructural characterization of materials / David Brandon and Wayne D. Kaplan(Wiley, c1999) |
| コード類 | 典拠ID=AU20113540 NCID=DA12120509 |
| 1 | Microstructural characterization of materials / David Brandon and Wayne D. Kaplan : cloth,: paper. - 2nd ed. - Chichester : Wiley , c2008 |