Watkins, George D.
著者名典拠詳細を表示
著者の属性 | 個人 |
---|---|
一般注記 | Microscopic identification of electronic defects in semiconductors, c1985: CIP t.p. (George D. Watkins; Lehigh Univ.) |
から見よ参照 | Watkins, G. D. |
コード類 | 典拠ID=AU20078412 NCID=DA02695479 |
1 | Radiation effects in semiconductors : [proceedings] / edited by James W. Corbett [and] George D. Watkins London ; New York : Gordon and Breach Science Publishers , [c1971] |