Eastern Analytical Symposium
著者名典拠詳細を表示
著者の属性 | 会議 |
---|---|
場所 | New York |
一般注記 | Its X-ray and electron methods ... 1968 Its (1987 : New York City). Trace metal analysis and speciation, 1991 |
Dates of Birth and Death | 1967 |
から見よ参照 | Analytical Symposium, Eastern EAS |
コード類 | 典拠ID=AU20075469 NCID=DA06938878 |
1 | Physical measurement and analysis of thin films / edited by E. M. Murt and W. G. Guldner New York : Plenum Press , 1969 |