Feldman, Leonard C.
著者名典拠詳細を表示
| 著者の属性 | 個人 |
|---|---|
| 一般注記 | His Materials analysis by ion channeling, 1982: CIP t.p. (Leonard C. Feldman; Bell Laboratories, Murray Hill, NJ) Mayer, J.W. Fundamentals of surface and thin film analysis, c1986 |
| から見よ参照 | フェルドマン, L. C. |
| コード類 | 典拠ID=AU20031115 NCID=DA00601962 |
| 1 | 表面と薄膜分析技術の基礎 / L.C.フェルドマン, J.W.メイヤー著 ; 栗山一男,山本康博訳 東京 : 海文堂 , 1989.6 |
| 2 | Thin film processing and characterization of high-temperature superconductors, Anaheim, CA, 1987 / editors, James M.E. Harper, Richard J. Colton, Leonard C. Feldman New York : American Institute of Physics , 1988 |
| 3 | Materials analysis by ion channeling : submicron crystallography / Leonard C. Feldman, James W. Mayer, S. Thomas Picraux New York ; Tokyo : Academic Press , 1982 |