Stavola, Michael
著者名典拠詳細を表示
| 著者の属性 | 個人 |
|---|---|
| 一般注記 | Defects in electronic materials, c1988: CIP t.p. (Michael Stavola; AT&T Bell Laboratories, Murry Hill, N.J., USA) |
| から見よ参照 | Stavola, M |
| コード類 | 典拠ID=AU20007465 NCID=DA02891852 |
| 1 | Identification of defects in semiconductors / volume editor Michael Stavola [A],[B]. - San Diego : Academic Press , c1998- |
| 2 | Hydrogen in crystalline semiconductors / S.J. Pearton, J.W. Corbett, M. Stavola : ger : pbk - . - Berlin ; New York : Springer-Verlag , c1992 |