Lannoo, M. (Michel), 1942-
著者名典拠詳細を表示
著者の属性 | 個人 |
---|---|
一般注記 | His Point defects in semiconductors, 1981- : v. 1, t.p. (M. Lannoo) verso t.p. (Dr. Michel Lannoo, Lab. d'étude des surfaces et interfaces, Physique des solides, Institut sup. d'électronique du Nord, Lille, France) CIP data sheet (b. 7/5/42) |
Dates of Birth and Death | 1942- |
から見よ参照 | Lannoo, Michel, 1942- |
コード類 | 典拠ID=AU20007062 NCID=DA01991104 |
1 | Point defects in semiconductors / M. Lannoo, J. Bourgoin ; with a foreword by J. Friedel v. 1 : us - v. 2 : gw. - Berlin ; New York : Springer-Verlag , 1981-1983 |