Seah, M. P.
著者名典拠詳細を表示
| 著者の属性 | 個人 |
|---|---|
| 一般注記 | Practical surface analysis by auger and photo-electron spectroscopy, c1983 (a.e.) CIP t.p. (M.P. Seah, Division of Materials Applications, National Physical Lab., Teddington, Middlesex) |
| から見よ参照 | シーア, M. P.<シーア, M. P.> |
| コード類 | 典拠ID=AU20006327 NCID=DA00014548 |
| 1 | Ion and neutral spectroscopy / edited by D. Briggs and M.P. Seah : Wiley,: Salle. - 2nd ed. - Chichester, West Sussex, England ; New York : Wiley. - Aarau ; Frankfurt am Main : Salle+Sauerländer , c1992 |
| 2 | 表面分析 : 基礎と応用 / D.ブリッグス, M.P.シーア編 ; 表面分析研究会訳 上巻,下巻. - [東京] : アグネ. - 東京 : アグネ承風社 (発売) , 1990 |
| 3 | Auger and x-ray photoelectron spectroscopy / edited by D. Briggs and M.P. Seah : Wiley - : paper. - 2nd ed. - Chichester, West Sussex, England ; New York : Wiley. - Frankfurt am Main : Salle. - Aarau : Sauerlander , c1990 |
| 4 | Practical surface analysis : by auger and X-ray photo-electron spectroscopy / edited by D. Briggs and M.P. Seah Chichester ; New York : Wiley , c1983 |